Ultra High Speed Fully-auto PL Mapping System

  • Product No:Imperia
  • Manufacturer:Onto Innovation Inc.(原Nanometrics Inc.)

With its unique optical design technology, the Imperia detects and classifies yieldkilling defects with the additional benefit of simultaneous state-of-the-art photoluminescence (PL) production monitoring.

There are significant economic savings to be gained by more accurately predicting MOCVD reactor yield and PM schedules. Combining these two post-epitaxial metrology screening functions into a single high throughput system minimizes valuable fab space use and cassette handling time.


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