PVE-80 is a Non-Contact (Pulse-Voltage excitation method) Ultra-Low Sheet resistance measurement system by Napson.
No damage measurement by non-contact Pulse-Voltage excitation method
Easy to measure & carry around, Removable stage plate
Easy operation and data processing by PC with Software
Measurement result can shown by 3 types of measurement unit(Sheet resistance[Ohm/Sq], Electric conductivity[S/cm], Electrical conduction[S])
Pulse-Voltage excitation method : Pat. No.5386394
Specifications(Tentative)
Measurement range：50u～1m ohm/sq
Accuracy：≦ 3%
Repeatability (CV)：≦ 0.1% ( % of sigma)
at 20 times measurement(same point)
Spot size：14 mm
Gap：2 mm (Distance between upper and lower probe）
Measurement Sample
Metal films ：Ag , Cu , Au , Al or others
