Patented, digital phase-shifting circuitry needs no calibration and is temperature independent.
Enhanced test diagnostics are better able to isolate component failures and require less intervention by the operator.
Line-related noise rejection has been made even better.
Complete re-design of the digital circuitry provides very high reliability.
Upper limit of test signal voltage has a minimum setting of 0.3 mV versus 0.5 mV previously.
Largest measurable capacitance is now 1.5 µF versus 1.2 µF previously.
A real-time clock has been added.
The serial interface is compatible with the IEEE-1174 Standard.
The front panel display is fully alphanumeric.
The number of LED indicators on the front panel has been increased from 8 to 10.
| Frequency | Accuracy | Stability | Temperature Coefficient | Resolution | |
| kHz | ppm | ppm/year | ppm/°C | aF | ppm |
| 0.1 | ±9 | ±<1.9 | ±0.07 | 16 | 0.8 |
| 1 | ±5 | ±<1.0 | ±0.035 | 0.8 | 0.16 |
| 10 | ±11 | ±<1.9 | ±0.07 | 2.4 | 0.5 |
