High Voltage/Current manual Prober

  • Product No:M200FA-HV
  • Manufacturer:Wentworth Laboratories

The M200FA Manual Probe Station specifically designed for failure analysis applications, Parametric (DC to Low Level), High Power & ULTRA fast I.V./C.V. probing.

  • Flexible for a wide range of applications,DC Parametric, Low Current, High Power plus many more.

  • Precision engineering for reliable and repeatable sub-micron probing.

  • Adaptable for industry standard testers.

  • Temperature probing from –65°C to +400°C utilizing Wentworth’s GuardMasterTM

  • Customizable product enhancing hardware and software options.

  • Easy to use fine/course X/Y controls and

  • Fine Adjust Z/Platen Adjustment.

  • Wide range of product enhancing accessories.

  • Robust mechanical design.

  • Cost effective test solutions.

SETTING THE STANDARD 

Wentworth's M200FA manual prober enables you to quickly obtain accurate measurements. At the core of M200FA is a highly stable, featureladen platform to capture repeatable, precision measurements. Ultilzing either Wentworth replaceable probes or DC cantilever probe cards the M200FA prober is an ideal platform for a variety of test applications.

HIGH POWER 

The M200FA High Power configuration addresses today’s power semiconductor test challenges with Low Contact Resistance Measurements requiring accurate measurements at high voltages. Kelvin Chucks & Backside probing solutions allow Contact Resistance measurements in the milli ohm range.

High Current probes & probe cards (up to 100A) handle and distribute excessive current loads. Dedicated HV & HC probes reduce probe and device destruction at high voltages/currents to prevent device heating and arcing at the tip.


DC parameter

  • Frequency:dc > 100Mhz

  • Breakdown Voltage:500V

  • Leakage:+/-10fA (-65°C > +200°C)

          +/-20fA (+200°C > +400°C)

High Power

  • Voltage:3KV (Triax), 10KV (Coax)

  • Current:200 Amps (Pulsed)

  • Leakage:<1pA (3KV)

M200FA SPECIFICATIONS

XY STAGE

PLATEN

X Travel

210mm (8.25") manual travel

Height Adjustment

Via fine adjustment wheel

Y Travel

310mm (12.21") manual travel

Separation lift

10 mm (0.4”)

LINEAR MOTION GUIDES

DIMENSIONS (WxDxH)

Coarse ratio 1:1

70 microns per degree

Prober (excludes optics)

840x842x610mm

33x32x34”

Fine ration 10:1

7 microns per degree

SHIELDING

CHUCK

Light

> 120 db

Chuck Flatness

Flat to within 10 µm (0.0004”)

EMI

> 20 db 0.05-0.5 Ghz, 30 db 0.5-30 Ghz

Theta

Micrometer drive theta, 15º

Weight

Fine Lift Movement

Fine lift 250 microns

Prober

131 kg

Fine ratio 10:1

7 microns per degree