4 POINT PROBE sheet resistance measurement system is consist of 5601TSR sheet resistance tester and QT-50 manual test stage. This system use the 4 Point Probe principle to measure the sheet resistance and resistivity.
The measurement sample could be wafer, ITO and other semiconductor materials. The dimension of sample could be square or circle. The machine is small, potable and easy opertion. Option: QT-60 large manual test stage, QT-70 auto test stage and ST-610A handheld probe.
Functional Performance:
5601TSR sheet resistance tester
Maximun Display: 150000(sheet resistanceΩ/□)/33000(normal resistanceΩ)
Sampling Rate: 4 samples/sec
Display: 6 digits, LED dispaly
Overload Indication: “00000” Flashing
Range selection: Manual or Auto
Overload protection: AC 330Vrms
Working voltage: AC90V~264V, 50/60Hz<15VA
Operating temperature: 0~50°C, RH≦80%
Communication interface: RS232, RS485
Baud rate: 1200/2400/4800/9600/19200/38400/57600/115200
Dimension: 208x 91x 280mm
QT-50 manual test stage:
Manual machines under pressure lever arm positioning function for detecting
Needle pressure: Change the pressure by external additive
weight： 50~500g
Dimension: 300x250x200mm
Test stage size: Diameter 150mm, 6” wafer
Weight: 7kg
Measuring materials for wafer or ITO film and other materials
Measurement size can be wafer or square size
Measure the surface resistance value Ω / □ directly without calculation
System is small, light weight, easy to operate, with anti-static function
Optional QT-60 large-size manual test console, QT-70 automatic probe test station or ST-610 handheld probe for measurement
Application:
Solar photoelectric material
Conductive polymeric material
Transparent conducting films material
ITO film
Nano materials
Micro molecule organic light
Emitting materials
Biochip coating materials
