Hall Effect Measurement System

  • Product No:HL9900
  • Manufacturer:Toho Technolog Inc.

The Toho Technology HL9900 is a turn-key, high performance Hall System for the measurement of resistivity, carrier concentration and mobility in semiconductors. Modular in concept, allowing easy upgrade paths, the system is suitable for a wide variety of materials, including silicon and compound semiconductors and metal oxide films.

The system has both low and high resistivity measurement capabilities, with dual temperature capability and an optional cryostats extending the temperature range from below 90 K to 500 K. The computer is Microsoft® Windows based.

Completely succeeding from Nanometrcis HL5500PC Hall Effect measurement system.

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