The NP-AFM is a complete nanoprofiler tool including everything required for scanning samples: microscope stage, electronic box, control computer, probes, manuals, and a video microscope. Samples as large as 200 mm X 200 mm X 20 mm are profiled by the NP-AFM system, and several stage options are available for many types of samples.
Nanoprofiler AFM for: - Technical Samples
- Wafers and Discs
Three sample stage options to accommodate substrates up to 200mm X 200mm X 20mm
Integrated high resolution video microscope
Linearized xy piezoelectric scanner
Accommodates standard-sized AFM probes
Includes vibrating and non-vibrating topography modes, plus lateral force and phase mode imaging
Utilizes a direct drive motorized probe approach
Captures images with intuitive LabVIEW-based software
Using the industry standard light lever force sensor, all of the standard scanning modes are included with the system. Vibrating mode is used for high resolution and soft samples, while non-vibrating mode can be used for routine scanning. Also included with the system are phase and lateral force modes.
Control software, written in LabVIEW, is simple and intuitive to use. Differing windows walk users through the process: A pre-scan window helps align the AFM probe, a scanning window aids in acquiring images, a force position window is used for measuring F/D curves, and finally, a system window assists in altering system parameters.
Use the NP-AFM for routine scanning of technical samples such as wafers and disks or for nanotechnology research.