Nanoprofiler AFM

  • Product No:NP-AFM
  • Manufacturer:AFMWorkshop

The NP-AFM is a complete nanoprofiler tool including everything required for scanning samples: microscope stage, electronic box, control computer, probes, manuals, and a video microscope. Samples as large as 200 mm X 200 mm X 20 mm are profiled by the NP-AFM system, and several stage options are available for many types of samples.

  • Nanoprofiler AFM for: - Technical Samples 

  •                      - Wafers and Discs 

  • Three sample stage options to accommodate substrates up to 200mm X 200mm X 20mm 

  • Integrated high resolution video microscope 

  • Linearized xy piezoelectric scanner 

  • Accommodates standard-sized AFM probes 

  • Includes vibrating and non-vibrating topography modes, plus lateral force and phase mode imaging 

  • Utilizes a direct drive motorized probe approach 

  • Captures images with intuitive LabVIEW-based software

Using the industry standard light lever force sensor, all of the standard scanning modes are included with the system. Vibrating mode is used for high resolution and soft samples, while non-vibrating mode can be used for routine scanning. Also included with the system are phase and lateral force modes.

Control software, written in LabVIEW, is simple and intuitive to use. Differing windows walk users through the process: A pre-scan window helps align the AFM probe, a scanning window aids in acquiring images, a force position window is used for measuring F/D curves, and finally, a system window assists in altering system parameters.

Use the NP-AFM for routine scanning of technical samples such as wafers and disks or for nanotechnology research.

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