Scanning Analysis AFM

  • Product No:SA-AFM
  • Manufacturer:AFMWorkshop

Use the SA-AFM for scanning life science samples, large samples, routine scanning of technical samples, or for nanotechnology research. The SA-AFM is a complete system and includes everything required for scanning all sizes and shapes of samples. It is easily integrated with all manufacturer’s inverted microscopes.

  • Flexible, stand alone design 

  • Scans any sample size 

  • Adaptable to inverted microscopes 

  • Linearized xy piezoelectric scanner 

  • Accommodates widest range of standard AFM probes 

  • All standard modes, including vibrating, non-vibrating, and phase 

  • Direct drive motorized probe approach 

  • Intuitive LabVIEW-based software for image capture

Using the industry standard light lever force sensor, all standard scanning modes are included with the system. Vibrating mode is used for high resolution and soft samples, while non-vibrating mode can be used for routine scanning. Also included with the system are phase and lateral force modes.

Control software, written in LabVIEW, is simple and intuitive to use. Differing windows walk users through the process: a pre-scan window helps align the AFM probe, a scanning window aids in acquiring images, a force position window measures force distance curves, and finally, a system window assists in altering system parameters.

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