Charged Device Model (CDM) is to simulate a discharge to metal from any metal terminal of a charged electronic component or from a small metal tool held by a charged human body to metal terminal of an electronic component. CDM discharge causes very fast charge transfer, and then component is damaged by the voltage stress. The CDM test system analyzes the robustness of component against CDM stress. Model 550 optionally includes robustness measurement refer to total amount of discharged charge, addition to robustness measurement refer to charged voltage. Fully automated CDM test may be available if optional DC test with test heads is specified.
Meets JEDEC, EIAJ and ESDA specifications
Direct charging CDM Test (Model 550D Series)
Field-Induced CDM Test System (Model 550F Series)
Direct charging and Field-Induced CDM Test System (Model 550DF Series)
Stable and repeatable discharge waveform
Easy positioning between DUT pin and contact tip
DUT capacitance measurement at high charged voltage
Damage charge or damage energy can be measured
Up to 10 DUTs on DUT jig
BGA and TCP tested easily
Relay discharge available
Network operation
Pin count: 1024/DUT
Max # of DUT: 10/DUT jig
DUT type: DIP, QFP, SOP, TAB and others
Zapping Voltage: 0 ~ ±4kV, 10V step
Positioning Accuracy: <±0.05mm
Power supply: 100CAV±10%, 1φ, 300VA (Excluding PC)
Size/weight: 580W x 530D x 370H, 20kg (Excluding PC)，1400W x 800D x 1070H, 140kg (Including PC and table/rack)
CDM-550D
·Method: Direct charging
·Test Standard: EIAJ, ESDA,(JEDEC)
·Positioning: CCD camera, capacitance sensor and interrupter
CDM-550DQ
Coulomb meter is added to ①．
·Coulomb measurement range:
0.0~100nC(with 0.1nC increment)
CDM-550FQ
·Method: Field-induced charging
·Test Standard: (EIAJ), ESDA, JEDEC
·Positioning: CCD camera, Coulomb meter and interrupter
CDM-550DFQ
·Method: Direct charging and Field induced charging
·Test Standard: EIAJ, ESDA, JEDEC
·Positioning: CCD camera, capacitance sensor, Coulomb meter and interrupter
CDM-550DFQM
DC measurement system added to ④. Pin count and pin pitch limitation exist for automated test.
Pin count : < 257 pins
Pin pitch : > 0.4mm
DC Measurement system specifications (For damage detection)
Measurement
·V-I curve comparison method
·DC parameter comparison method
2. Source measure unit
·Source voltage: 0 ~ ±30V
·Accuracy: < ±2% ±10mV
·Current range: 0 ~ 100mA
·Accuracy:<±2% ±2LSB±Voltage error
3. Bias supply(VCC1)
·Voltage range: 0 ~ ±30V
·Accuracy: < ±2% ±50mV
·Current range: 0 ~ 500mA
·Accuracy: <±2% ±2mA
4. Bias supply(VCC2)
·Voltage range: 0 ~ ±15V
·Accuracy: < ±2% ±50mV
·Current range: 0 ~ 500mA
·Accuracy: <±2% ±2mA
5. Pin Matrix
·Pin count: Max. 256
·Each DUT is connected to one of below VCC1, VCC2, Source measure unit, Ground, pull-up (to VCC1 via 10kΩ) or pull-down (to ground via 10kΩ)
