FM-JX 100

  • Product No:FM-JX 100
  • Manufacturer:Suzhou flyingman Precision Instrument Co., Ltd.

Transflective high-definition metallurgical microscopes are developed for the needs of the semiconductor industry, silicon wafer manufacturing, electronic information industry, and metallurgical industries. They can be used as advanced metallurgical microscope users to experience superior performance and can be widely used in semiconductors and FPDs. , circuit packaging, circuit boards, materials, castings / metal / ceramic parts, precision mold testing.

This instrument adopts two types of illumination: epi-illumination and transmission. In epi-illumination, bright and dark field observation, DIC observation, and polarized observation can be performed. Brightfield observation under transmitted light. Stable, high-quality optical system makes imaging more clear and better in contrast. Ergonomic design allows you to feel comfortable and relaxed at work.

  • High-speed spectral transmission technology for microsecond spectral detection

  • Low spurious technology

  • Full spectrum technology with wide spectrum coverage of 320 ~ 1100nm

  • UV sensitization technology enables deep ultraviolet spectroscopy detection

  • Spatial resolution: minimum 5X5um2


Optical   system

Infinity   optical system, tube lensf=200mm

Observation tube

Trinocular tube (with   0.3XCCD adapter)

Eyepiece

1Super wide field flat eyepiece WF10X/26mm  2WF10X/22mmWith 0.1mm cross reticle

Objectives

Long   Working Distance Plane Infinity Bright/Dark Field Objectives5X/NA0.20(W.D=14.47mm)10X/NA0.25(W.D=16.0mm) 20X/NA0.40(W.D=10.5mm)50X/NA0.55(W.D=5.1mm)

Objective   Converter

Large   four-hole converter with DIC jack

Stage

Precision   measurement platformMoving range 50mmX50mmaccuracy 3u+L/25

Filter

Color   filter (green, blue, neutral)

Focusing

Electric   focusing

Light   Source

Transmission   lighting LED   light 5WWide voltage AC85V—260VContinuously adjustable brightness

Reflected   illuminationKohler halogen lighting 12V50WWide voltage AC85V—260VContinuously adjustable brightness   with aperture diaphragm and field diaphragm

Polarizer

Analyzer   can rotate 360 degreesPolarizer and analyzer   can remove optical path

Detection   Tool

Standard   ruler: 0.01mm micrometer

Options

1Professional metallographic image   analysis software with measurement function    

2Differential Interference (DIC)   device    

3Long Working Distance Plane Infinity   Bright/Dark Field Objectives80X/0.75(W.D=4.0mm)100X/0.80(W.D=3.0mm)    

43 million pixels, 5 million pixels,   800,000 pixels, 10 million pixels CMOS     

5Digital display scale      

6Rotary table