RG-200PV is a special design for solar cell sheet resistance measurement system by Napson.
High speed and high tact performance, High stable measurement
High accurate dual configuration measurement and Selftest function
Silicon solar wafers 156 x 156 mm or less , thickness 100µm ~ 5 mm compatible
X-Y multi patterns with 0.1 mm resolution and 2-D,3-D mapping measurement
Sample sizes
~156 x 156 mm
Measuring range
1m ohm/sq ~ 10,000k (10M )ohm/sq