Non-contact sheet resistance multi-points measurement system

  • Product No:NC-80MAP
  • Manufacturer:Napson Corp.

NC-80MAP is a semi-automatic eddy current sheet resistance/resistivity measurement system by Napson.


  • Possible to measure wide range of sheet resistance by installing Max. 4 probes

  • Min. 7 mm position from edge can be measured

  • User programable measurement pattern & programmable measuring pattern

  • Option: thickness measurement probe (for silicon wafer)
           


  • Sample sizes
    2 ~ 8 inch (Option; 12 inch)

  • Measuring range
    [R] 1m ~ 200 Ω・cm
    [RS] 10m ~ 3,000 Ω/sq

  • The range is separated from each Low, Middle, High and S-High probe type.