This test equipment is a snapback characteristic analysis tester that can measure the protection circuit against electric discharge of semiconductor and perform stress test. You can apply a constant current to the sample, measure the diode curve of the protection circuit, and perform the electrostatic breakdown test of the device that correlates with the ESD test.
High Voltage
0-±400V
0-±4KV
Polarity
Switchable by positive & negative switch
Numbers of discharges
1-99times
2-digit digital switch
TLP specification
Maximum charging Voltage：±4KV
VL voltage：0-±2KV
IL current：0-±6A
Rise time：10ns or less
Pulse width：By PW pulse width transmission unit
