This test equipment is compatible with test devices of various sizes. In particular, it supports testing of extremely small fine pitch devices.
Easy to align the device to be tested. Manual operation and semi-automatic test are possible.
After zapping, DC measurement can support.
1. Suitable for samples of various shapes
2. Ideal for ESD testing of microdevices
・ Approaching fine pitch with a digital microscope
・ Contact microdevices with a manipulator
・ Smooth alignment by X-Y stage
3. HBM, MM test is possible by option selection
4. HBM test maximum: 8KV
・Test pin: Single pin
・Standards: JEDEC, AEC, EOS
・DC measurement function: Maximum 30V/1A (Minimum 10mV/10nA )
・Test voltage : HBM 125V to 8KV MM 10V to 2KV
・Number of ESD pulse: 1 to 10 or continuous
・DUT mounting part: IC socket or device alone
■HBM application
■HBM application and destruction， judgment function
■MM application
■MM test and destruction judgment function
Model Name:
HBM/ MM Model：EMD-625E( With option)
