NC-2000FLA is a fully automatic silicon wafer sorting machine launched by Japan's Napson company. It can provide measurement functions such as resistivity, thickness, flatness, PN TYPE and silicon wafer diameter detection. The number of wafer cassettes that need to be sorted can be customized according to customer requirements, and the silicon wafers are transported by robots and non-destructive measurement methods throughout the process.
Application: 3-12 inch silicon wafer
Test data can be exported through CSV format files, supporting SECS/GEM communication protocol.
Sample size:
3-12 inch
Measuring range:
0.0006~210ohm.cm
Thickness measurement range:
300-1300um, or other special range requirements
Can add flatness measurement function, PN type test, wafer diameter, etc.
