2” GaN晶圓/外延片測試;測試VF,亮度,波長,半高寬等
提供 MOCVD RUN to RUN 參數設定依據 ,避免制程浪費
LED wafer平均分佈9點位置量測,產線中端QC最佳利器
自動/半自動測量模式,30秒內自動測試完9點之資料
搭配臺灣 維明 LED測試機,光電參數全部測量
軟體功能強大
光度計規格:
Amperes 1.999E-09 to 1.999E-03
Watts 1.999E-09 to 1.999E-03
Joules 1.999E-09 to 1.999E-06
Lux 1.999E-02 to 1.999E+04
Lux-Seconds 1.999E-02 to 1.999E+01
Ft-Candle 1.999E-03 to 1.999E+03
Footlamberts 1.999E-01 to 1.999E+05
Nits 1.999E-01 to 1.999E+05
光譜儀規格:
Detector: 2048-element linear silicon CCD array
Effective range: 200-1100nm
nmDynamic range: 2 x 108
Sensitivity (estimate):
•86 photons/count; also, 2.9 x 10-17
joule/count
•2.9 x 10-17 watts/count (for 1-second
integration)
Signal-to-noise: 250:1 (at full signal)
Dark noise: 2.5-4.0 (RMS)