There is a requirement of fast DC test such as open/short of any DUT pins, though complete performance test is not requested. Simplified IC test before and after burn-in, screening before the final test or before shipment are some of these examples.For this type of application, fast and inexpensive open/short tester is more suitable than the full DC tester that has plentiful test functions. ESPIER 2001 is suitable for such an application. Not only open/short test but a little more sophisticated test such as input leakage test, supply current test and write/read test of a specified memory location may be included.
Stand alone operation
Simultaneous comparison by 4 analog comparators
Long life and high reliability by semiconductor relays
Constant current applied/voltage measurement test
Easy connection with automated handler
Easy pin expansion
Easy programming and storage of test program
Host PC controllable
Constant current(IF)
Current range: 0μA to ±255μA
Resolution: 1μA
Accuracy: ±2% of the value ±2μA
2.2 Voltage measurement (VM)
Voltage Range: 0 to ±10V in 2.5mV resolution
Resolution: 2.5mV
Analog accuracy: ±2% of comparison voltage±15mV
Digital accuracy: ±0.1mV±10mV
