Napson 4-point resistivity / sheet resistance systems are using high performance probe heads which are made by Jandel Engineering Limited of England.Jandel probe head performs high precise measurement of resistivity and sheet resistance for silicon wafers, epitaxial layers, diffusion layers, ITO layers, metal layers and more, so that Jandel probes have a good evaluation for many years.
Needle Material: TC [Tungsten carbide] (or OS: Osmium alloy)
Radius: 40 um (25 um to 500 um)
Loads (g/needle): 200ｇ(10g to 250g)
Spacing: 1.00 mm (0.5 mm to 1.59 mm)
Arrangement: Linear (standard) (Square is available
